A sampling scheme for resubmitted lots based on one-sided capability indices

Nani Kurniati, Ruey Huei Yeh, Chien Wei Wu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

Acceptance sampling plans provide decision rules for lot acceptance determination based on the required quality levels and allowable risks. In this paper, we develop a variables sampling plan based on the one-sided process capability indices, CPU and CPL, when lot resubmissions are permitted on non-acceptance of the original inspection. The plan parameters are determined by solving two non-linear equations simultaneously and fulfill the two-point condition on the operating characteristic (OC) curve. The OC curve of the proposed plan is derived based on the exact sampling distribution rather than approximation. Moreover, the behavior of the proposed resubmitted sampling plan for various parameters is examined and discussed. For practical purposes, the sample size and critical acceptance value are tabulated for various parameter values. An example is used to demonstrate the implementation of the proposed resubmitted sampling plan.

Original languageEnglish
Pages (from-to)501-515
Number of pages15
JournalQuality Technology and Quantitative Management
Volume12
Issue number4
DOIs
Publication statusPublished - 9 Feb 2016
Externally publishedYes

Keywords

  • Acceptance sampling
  • One-sided specification limit
  • Process yield
  • Sampling plan

Fingerprint

Dive into the research topics of 'A sampling scheme for resubmitted lots based on one-sided capability indices'. Together they form a unique fingerprint.

Cite this