Analysis of contaminant effect on ceramic & polymer insulator surface under artificial environmental condition

Daniar Fahmi, I. Made Yulistya Negara, Anisa Kusumaningrum, Dirman Hariono Santosa

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

Performance of an insulating dielectric may decrease due to aging. The main cause of aging on insulator is contaminant arising on the insulator surface. In this study, effects of contaminants on the coating large leakage current on the surface of the polymer insulator are investigated. To analyze the effects, accelerated age testing module as a form of pre-conditions on polymer insulator aging is designed. Furthermore, dielectric strength testing is performed to determine the effect of contaminants on pre-breakdown voltage. The results of this study showed that the thickness level of contaminants on the surface of the layer affects insulator leakage current and pre-breakdown voltage.

Original languageEnglish
Title of host publication2017 International Seminar on Intelligent Technology and Its Application
Subtitle of host publicationStrengthening the Link Between University Research and Industry to Support ASEAN Energy Sector, ISITIA 2017 - Proceeding
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages161-164
Number of pages4
ISBN (Electronic)9781538627068
DOIs
Publication statusPublished - 28 Nov 2017
Event18th International Seminar on Intelligent Technology and Its Application, ISITIA 2017 - Surabaya, Indonesia
Duration: 28 Aug 201729 Aug 2017

Publication series

Name2017 International Seminar on Intelligent Technology and Its Application: Strengthening the Link Between University Research and Industry to Support ASEAN Energy Sector, ISITIA 2017 - Proceeding
Volume2017-January

Conference

Conference18th International Seminar on Intelligent Technology and Its Application, ISITIA 2017
Country/TerritoryIndonesia
CitySurabaya
Period28/08/1729/08/17

Keywords

  • Contaminant
  • Leakage current
  • Pre-breakdown voltage
  • Testing acceleration age insulator

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