Applied of look up table controller based of FLC (fuzzy logic controller) in non-linear system AFM (atomic force microscopy)/PSTM (photon scanning tunnel microscope)

S. Ari, B. Belier, M. Nuh, A. Jazidie, M. Rameli, M. Castagne, P. Falgayrttes

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

The problems of AFM/PSTM with piezoelectronic motor are how to control the fast and precise motion of the piezoelectronic because of its nonlinear hysteresis characteristic. On the other hand, in order to scan the surface and optical characteristics simultaneously in semiconductor material using AFM/PSTM, high speed microscope motion is required. FLC is one of the most effective algorithms to control a nonlinear system. This paper, the application of FLC to AFM/PSTM as a class nonlinear system is proposed. A look up table (LUT) controller based on FLC is used in order to overcome the quick response of the piezoelectronic motor. It was shown that the obtained images are noisy and the filter could not perfectly eliminate the noise. Nevertheless, the LUT controller based on FLC is able to overcome the nonlinear and noise problems well.

Original languageEnglish
Title of host publicationProceedings - APCCAS 2002
Subtitle of host publicationAsia-Pacific Conference on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages565-568
Number of pages4
ISBN (Electronic)0780376900
DOIs
Publication statusPublished - 2002
EventAsia-Pacific Conference on Circuits and Systems, APCCAS 2002 - Denpasar, Bali, Indonesia
Duration: 28 Oct 200231 Oct 2002

Publication series

NameIEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
Volume2

Conference

ConferenceAsia-Pacific Conference on Circuits and Systems, APCCAS 2002
Country/TerritoryIndonesia
CityDenpasar, Bali
Period28/10/0231/10/02

Keywords

  • Atomic force microscopy
  • Control systems
  • Force control
  • Fuzzy logic
  • Hysteresis motors
  • Nonlinear control systems
  • Nonlinear systems
  • Optical control
  • Optical microscopy
  • Semiconductor device noise

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