Characterization of bam and pani-based radar absorbency (Ram) behavior with multilayer geometry structure for x-band absorption

Behavioral characterization of radar absorbent material consisting of Polyaniline (PANi) and Barium M-hexaferrite (BaM) has been successfully synthesized by solid state method. Polyaniline conductive material was synthesized using the polymerization method with DBSA dopant. A Radar Absorbing Materials (RAM) is characterized by X-Ray Fluorescence (XRF), X-Ray Diffraction (XRD), Fourier Transform Infrared (FTIR), Four Point Probe (FPP), Scanning Electron Microscope (SEM) and Vector Network Analyzer (VNA). The ion Zn²⁺ is doped into the BAM structure, where Zn²⁺ ions replace Fe²⁺ ions in hexaferrite barium so that the phase becomes soft magnetic materials. RAM and PANi particles are combined with ship paint to form radar wave absorbent coatings. The layer is coated with multilayer geometry on AH 36 type A steel, with thicknesses of 2.4 mm, 3.6 mm, 4.8 mm and 6 mm respectively. The X-band wave absorption was identified by VNA testing, where the maximum reflection loss value was found at 6mm thickness with a reflection loss value-32.6 dB at 8.4 GHz frequency. Reflection loss values of multilayer variations with a thickness of 2.4 mm, 3.6 mm and 4.8 mm each have reflection loss values of-8.02 dB,-19.13 dB and-28.9 dB respectively in the x band frequency range.