TY - GEN
T1 - Coffee Defects Detection Based on Green Bean Images Using YOLO Architecture
AU - Adiwijaya, Nelly Oktavia
AU - Sarno, Riyanarto
AU - Wijaya, Dedy Rahman
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - The quality of coffee beans significantly impacts the overall value of coffee production, and detecting defective beans is a crucial step in ensuring high standards. The traditional coffee bean quality assessment process is time-consuming and subjective, relying heavily on the expertise of a Q grader. However, there is an alternative approach using deep learning technology to develop more portable and trainable tools that can achieve high accuracy. This study compares the performance of two deep learning-based object detection methods, YOLOv8 and YOLOv10, for detecting defects in green Arabica coffee beans, categorized into two different types of primary defects. The research methodology involved collecting data, preprocessing, designing models, training, and testing. The dataset consists of 700 images of coffee beans divided into two classes, brown beans and dried cherries. YOLOv8n achieved a test accuracy of mAP50 0.995 and mAP50-95 0.875, while YOLOv10n attained a test accuracy of mAP50 0.992 and mAP50-95 0.859. In terms of computational efficiency, YOLOv8n completed training in 0.499 hours, whereas YOLOv10n finished in 0.479 hours. Despite the marginal difference in accuracy, both models demonstrate high potential for real-time detection in the coffee industry, with YOLOv8n slightly outperforming YOLOv10n in accuracy, but YOLOv10n being slightly faster. These results suggest that both methods can be effectively utilized for defect detection, offering scalable solutions for the coffee processing industry, particularly in the sorting process, to ensure the production of high-quality, valuable coffee beans.
AB - The quality of coffee beans significantly impacts the overall value of coffee production, and detecting defective beans is a crucial step in ensuring high standards. The traditional coffee bean quality assessment process is time-consuming and subjective, relying heavily on the expertise of a Q grader. However, there is an alternative approach using deep learning technology to develop more portable and trainable tools that can achieve high accuracy. This study compares the performance of two deep learning-based object detection methods, YOLOv8 and YOLOv10, for detecting defects in green Arabica coffee beans, categorized into two different types of primary defects. The research methodology involved collecting data, preprocessing, designing models, training, and testing. The dataset consists of 700 images of coffee beans divided into two classes, brown beans and dried cherries. YOLOv8n achieved a test accuracy of mAP50 0.995 and mAP50-95 0.875, while YOLOv10n attained a test accuracy of mAP50 0.992 and mAP50-95 0.859. In terms of computational efficiency, YOLOv8n completed training in 0.499 hours, whereas YOLOv10n finished in 0.479 hours. Despite the marginal difference in accuracy, both models demonstrate high potential for real-time detection in the coffee industry, with YOLOv8n slightly outperforming YOLOv10n in accuracy, but YOLOv10n being slightly faster. These results suggest that both methods can be effectively utilized for defect detection, offering scalable solutions for the coffee processing industry, particularly in the sorting process, to ensure the production of high-quality, valuable coffee beans.
KW - YOLOv10
KW - YOLOv8
KW - coffee defects
KW - deep learning
KW - object detection
UR - https://www.scopus.com/pages/publications/85218101323
U2 - 10.1109/ICEECIT63698.2024.10859988
DO - 10.1109/ICEECIT63698.2024.10859988
M3 - Conference contribution
AN - SCOPUS:85218101323
T3 - ICEECIT 2024 - Proceedings: 2nd International Conference on Electrical Engineering, Computer and Information Technology 2024
SP - 314
EP - 319
BT - ICEECIT 2024 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd IEEE International Conference on Electrical Engineering, Computer and Information Technology, ICEECIT 2024
Y2 - 22 November 2024 through 23 November 2024
ER -