Detection of Series Arc Faults in Photovoltaic System Based on Wavelet Filter Evaluation

Bagus Septianto, Dimas Anton Asfani, I. Made Yulistya Negara, Arief Budi Ksatria, Daniar Fahmi, Adams Tryas Alfian, Ibrahim Sefik

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Series Arc Faults (SAFs) in PV systems are very difficult to detect owing to inverter noise. Therefore, this study aims to detect SAFs by evaluating data collected from three different measurement: current measurement, voltage measurement on the arc fault generator, and PV voltage measurement with three different case studies based on the amount of Photovoltaic (PV) voltage from the Direct Current Power Supply (DCPS) that can simulate real PV conditions. Three wavelet filter types, such as Haar, Daubechies 4 (db4), and Biortogonal 3.1 (3.1) with a decomposition level of 15. The findings of this research indicate that the PV voltage is capable of measuring SAFs with evaluating wavelet filter. In addition, the arcing power in the steady state increased as the PV source voltage increased. The threshold limits for normal conditions can be established using the Haar wavelet filter method and db4 detail coefficient value. However, it is not recommended to utilize the Bior 3.1 method for detecting SAFs in PV systems because of the high inverter noise during normal conditions in some cases. The contribution of this study is that detection using the PV voltage can be performed for arcing detection with wavelet filter evaluation.

Original languageEnglish
Title of host publicationProceedings of the IEEE Region 10 Conference 2024
Subtitle of host publicationArtificial Intelligence and Deep Learning Technologies for Sustainable Future, TENCON 2024
EditorsBin Luo, Sanjib Kumar Sahoo, Yee Hui Lee, Christopher H T Lee, Michael Ong, Arokiaswami Alphones
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages739-742
Number of pages4
ISBN (Electronic)9798350350821
DOIs
Publication statusPublished - 2024
Event2024 IEEE Region 10 Conference, TENCON 2024 - Singapore, Singapore
Duration: 1 Dec 20244 Dec 2024

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
ISSN (Print)2159-3442
ISSN (Electronic)2159-3450

Conference

Conference2024 IEEE Region 10 Conference, TENCON 2024
Country/TerritorySingapore
CitySingapore
Period1/12/244/12/24

Keywords

  • Arc Faults
  • Data Processing
  • Photovoltaic Systems
  • Series Arc Fault
  • Wavelet Filter

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