High Voltage Circuit Breaker Contact Resistance Assessment with Synchronization Test Using Failure Mode Effect Analysis (FMEA)

Muhammad Septian Wijaya*, I. Made Yulistya Negara, I. Gusti Ngurah Satriyadi Hernanda

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This study focused on because increase contact resistance value then analyze use Failure Mode Effect Analyze (FMEA) with Risk Priority Number (RPN) calculation. Where there is ten step analysis FMEA from beginning determination 4 “cause effect” until determination change circuit breaker (CB) in Extra High Voltage Substation (GITET) 500kV Krian. After that it produces a worksheet to make it easier to check maintain and analyze failures on the CB with a numerical scale. It is a method of reasoning the impact of all possible failures that result increase contact resistance. The cause-effect is the main test performed is the synchronization test when opened/closed. In addition, there are 3 other cause effects, equipment life, thermovision, and visual inspection. After testing and analysis, it was found that the value of contact resistance on CB 7B2 increased with an increase in the value of contact resistance in the R phase of 19.7 µΩ, the S phase of 4.8 µΩ, and the T phase of 6.9 µΩ. Testing of the four cause effects was then analyzed using the FMEA method with the results that of the four cause effects, the one that had the most influence on the increase in the value of contact resistance was thermovision with a Risk Priority Number (RPN) value of 280. After that analyze the comparison of contact resistance value with temperature (thermovision) and open/close circuit breaker (synchronization test).

Original languageEnglish
Title of host publication2021 2nd International Conference on Information Technology, Advanced Mechanical and Electrical Engineering, ICITAMEE 2021
EditorsYessi Jusman, Hanifah Rahmi Fajrin
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735442863
DOIs
Publication statusPublished - 30 Nov 2022
Externally publishedYes
Event2nd International Conference on Information Technology, Advanced Mechanical and Electrical Engineering, ICITAMEE 2021 - Yogyakarta, Indonesia
Duration: 25 Aug 202126 Aug 2021

Publication series

NameAIP Conference Proceedings
Volume2499
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference2nd International Conference on Information Technology, Advanced Mechanical and Electrical Engineering, ICITAMEE 2021
Country/TerritoryIndonesia
CityYogyakarta
Period25/08/2126/08/21

Keywords

  • Contact Resistance
  • Failure Mode Effect Analysis
  • Synchronization Test

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