TY - GEN
T1 - Image thresholding based on index of fuzziness and fuzzy similarity measure
AU - Pratamasunu, Gulpi Qorik Oktagalu
AU - Hu, Zhencheng
AU - Arifin, Agus Zainal
AU - Yuniarti, Anny
AU - Navastara, Dini Adni
AU - Wijaya, Arya Yudhi
AU - Khotimah, Wijayanti Nurul
AU - Asano, Akira
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/4/7
Y1 - 2016/4/7
N2 - In this paper, we propose an automatic image thresholding method based on an index of fuzziness and a fuzzy similarity measure. This work aims at overcoming the limitation of the existing method which is semi-supervised. Using an index of fuzziness, two initial regions of gray levels located at the boundaries of the histogram are defined based on the fuzzy region. Then the threshold point is found by using a fuzzy similarity measure. No prior knowledge of the image is required. Experiments on practical images illustrate the effectiveness of the proposed method.
AB - In this paper, we propose an automatic image thresholding method based on an index of fuzziness and a fuzzy similarity measure. This work aims at overcoming the limitation of the existing method which is semi-supervised. Using an index of fuzziness, two initial regions of gray levels located at the boundaries of the histogram are defined based on the fuzzy region. Then the threshold point is found by using a fuzzy similarity measure. No prior knowledge of the image is required. Experiments on practical images illustrate the effectiveness of the proposed method.
KW - fuzzy similarity measure
KW - image thresholding
KW - index of fuzziness
UR - http://www.scopus.com/inward/record.url?scp=84966671571&partnerID=8YFLogxK
U2 - 10.1109/IWCIA.2015.7449483
DO - 10.1109/IWCIA.2015.7449483
M3 - Conference contribution
AN - SCOPUS:84966671571
T3 - 2015 IEEE 8th International Workshop on Computational Intelligence and Applications, IWCIA 2015 - Proceedings
SP - 161
EP - 166
BT - 2015 IEEE 8th International Workshop on Computational Intelligence and Applications, IWCIA 2015 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th IEEE International Workshop on Computational Intelligence and Applications, IWCIA 2015
Y2 - 6 November 2015 through 7 November 2015
ER -