TY - GEN
T1 - Implementation of RFID Attendance System with Face Detection using Validation Viola-Jones and Local Binary Pattern Histogram Method
AU - Basthomi, Faisal Rohman
AU - Nasikhin, Khoirun
AU - Sa'Adah, Roudhotul Auliya
AU - Prasetyo, Dendy Dwi
AU - Syai'In, Mat
AU - Rinanto, Noorman
AU - Endrasmono, Joko
AU - Indarti, Rini
AU - Setiyoko, Annas Singgih
AU - Sukoco, Didik
AU - Herijono, Budi
AU - Soeprijanto, Adi Adi
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/10
Y1 - 2019/10
N2 - In this study, attendance system was created by combines RFID attendance technology and face recognition. The attendance system is an important thing to facilitate attendance data retrieval. Attendance system often encountered in the technological era such as today is the RFID attendance system. Although the attendance system is already sophisticated, this system still has shortcomings such as the occurrence of entrusted cards. In this research, the writer has two inputs, namely ID on the RFID card and a face image. Face images will be process by two methods there are the Viola-Jones method that use to detecting the face objects in the image, and the Local Binary Pattern Histogram method as face recognition. Furthermore, if the face was recognized then the RFID card ID data and face recognition data will compare, the results of this process will be attended data in the database. Based on the results of test have been done by the author, the response system shows very good results. In the first test of the RFID sensor in 11 tests, the sensor was able to distinguish all cards that had been registered and cards that had not been registered. This test is carried out from distance of 1 cm to 4 cm. Furthermore, in the second test of facial recognition, in 100 trials of facial recognition testing with different facial poses, the system can recognize faces 93 times so system has 93% success rate. This success rate is influenced by several factors such as the test carried out at 364 lux illumination strength, the test distance at > 20cm and < 70cm, as well as the maximum testing angle 45°.
AB - In this study, attendance system was created by combines RFID attendance technology and face recognition. The attendance system is an important thing to facilitate attendance data retrieval. Attendance system often encountered in the technological era such as today is the RFID attendance system. Although the attendance system is already sophisticated, this system still has shortcomings such as the occurrence of entrusted cards. In this research, the writer has two inputs, namely ID on the RFID card and a face image. Face images will be process by two methods there are the Viola-Jones method that use to detecting the face objects in the image, and the Local Binary Pattern Histogram method as face recognition. Furthermore, if the face was recognized then the RFID card ID data and face recognition data will compare, the results of this process will be attended data in the database. Based on the results of test have been done by the author, the response system shows very good results. In the first test of the RFID sensor in 11 tests, the sensor was able to distinguish all cards that had been registered and cards that had not been registered. This test is carried out from distance of 1 cm to 4 cm. Furthermore, in the second test of facial recognition, in 100 trials of facial recognition testing with different facial poses, the system can recognize faces 93 times so system has 93% success rate. This success rate is influenced by several factors such as the test carried out at 364 lux illumination strength, the test distance at > 20cm and < 70cm, as well as the maximum testing angle 45°.
KW - Attendance System
KW - Facial Recognition
KW - Local Binary Pattern Histogram
KW - RFID
KW - Viola-Jones
UR - https://www.scopus.com/pages/publications/85076376708
U2 - 10.1109/ISESD.2019.8909430
DO - 10.1109/ISESD.2019.8909430
M3 - Conference contribution
AN - SCOPUS:85076376708
T3 - Proceeding - 2019 International Symposium on Electronics and Smart Devices, ISESD 2019
BT - Proceeding - 2019 International Symposium on Electronics and Smart Devices, ISESD 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th International Symposium on Electronics and Smart Devices, ISESD 2019
Y2 - 8 October 2019 through 9 October 2019
ER -