Manufacturing temperature and turbidity sensor based on ATMega 8535 microcontroller

Nike Ika Nuzula*, Wazirotus Sakinah, Endarko

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

The manufacturing of temperature and turbidity measurement system based on ATMega 8535 microcontroller has been done. To measure temperature, this system uses LM35 and photodiode to measure water turbidity. The principle of LM35 sensor is comparing temperature based on its resistance. Thus temperature that is converted to voltage can be detected. The Turbidity system in this experiment is using Nephelometer method with the light scattered by suspended particles in fluid, with LED and photodiode parallel to each other. This system can measure turbidity in 1 NTU -200 NTU with a close distance (1 inch) and a maximum relative error of 3.09% for the temperature measurement and also 3,12 % for turbidity measurement.

Original languageEnglish
Title of host publicationInternational Conference on Engineering, Science and Nanotechnology 2016, ICESNANO 2016
EditorsBudi Kristiawan, Agung Tri Wijayanta, Dominicus Danardono, Budi Santoso, Miftahul Anwar, Triyono, Syamsul Hadi, Joko Triyono, Eko Surojo, Dody Ariawan, Ubaidillah, Suyitno, Nurul Muhayat
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735414525
DOIs
Publication statusPublished - 3 Jan 2017
Event1st International Conference on Engineering, Science and Nanotechnology 2016, ICESNANO 2016 - Solo, Indonesia
Duration: 3 Aug 20165 Aug 2016

Publication series

NameAIP Conference Proceedings
Volume1788
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference1st International Conference on Engineering, Science and Nanotechnology 2016, ICESNANO 2016
Country/TerritoryIndonesia
CitySolo
Period3/08/165/08/16

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