The bilayer of MgF2-SiO2 films have been succesfully fabricated using pure MgF2 and SiO2 powders by spin-coating method. The structural examinations of the films covering phases were conducted by X-ray diffractometry, while the optical properties were characterized by UV-VIS spectrophotometry. The data with single layer characterization of the MgF2 and SiO2 films are also supplemented for a comparative study. Optical band gap energies for single layer MgF2, SiO2, and bilayer of MgF2-SiO2 were determined as 1.77 eV, 1.7209 eV, and 1.929 eV respectively. Optical parameters such as refractive index (n), extinction coefficient (K), and transmittance intensity variations were investigated. The realization of such hybrid bilayer systems are dispensible for optoelectronic devices applications.