Ratiometric wavelength monitor using a pair of symmetrical multimode interference structures based on silicon-on-insulator (SOI)

Agus Muhamad Hatta, Gerald Farrell, Yuliya Semenova, Harendra Fernando

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

An integrated ratiometric wavelength monitor consisting of a Y-branch and a pair of symmetrical multimode interference structures (MMI) based on silicon-on-insulator (SOI) is investigated numerically. Two symmetrical MMIs are optimized in terms of width and length to achieve overlapping opposite slope spectral responses. The designed ratiometric structure demonstrates a suitable spectral response for wavelength measurement, with a high resolution over a 100 nm wavelength range.

Original languageEnglish
Title of host publicationPhotonic Materials, Devices, and Applications III
DOIs
Publication statusPublished - 2009
Externally publishedYes
EventPhotonic Materials, Devices, and Applications III - Dresden, Germany
Duration: 4 May 20096 May 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7366
ISSN (Print)0277-786X

Conference

ConferencePhotonic Materials, Devices, and Applications III
Country/TerritoryGermany
CityDresden
Period4/05/096/05/09

Keywords

  • Edge filter
  • Multimode interference
  • Silicon-on-insulator
  • Wavelength monitor

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