Reduced energy bandgap of a-Si:H films deposited by PECVD at elevating temperatures

Yoyok Cahyono*, Umi Maslakah, Fuad Darul Muttaqin, Darminto

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

The hydrogenated amorphous silicon (a-Si:H) films with the thickness of several hundreds nanometer have successfully been grown on the glass substrates by plasma enhanced (PE) chemical vapor deposition (CVD), employing SiH4 gas with H2 dilution. The deposition temperatures being set from 150°C up to 250°C was intended to induce nanocrystalline clusters in the amorphous structure, to reduce dangling bond and to recover defect states in the gap, in order to obtain films with reduced energy band gap. The X-ray diffractometry, UV-Vis spectrometric and atomic force microscopic examinations were conducted to structurally study the samples. The reduction of energy bandgap from 1.89 eV down to 1.03 eV was obtained from the deposited films.

Original languageEnglish
Title of host publication6th International Conference on Theoretical and Applied Physics, 6th ICTAP
EditorsNur Hasanah, Tasrief Surungan, Dahlang Tahir, Halmar Halide
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735414693
DOIs
Publication statusPublished - 10 Jan 2017
Event6th International Conference on Theoretical and Applied Physics, ICTAP 2016 - Makassar, Indonesia
Duration: 19 Sept 201621 Sept 2016

Publication series

NameAIP Conference Proceedings
Volume1801
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference6th International Conference on Theoretical and Applied Physics, ICTAP 2016
Country/TerritoryIndonesia
CityMakassar
Period19/09/1621/09/16

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