Software Defect Prediction using Outlier Detection Algorithm

Riki Mi Roj Achmad*, Umi Laili Yuhana

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the dynamic landscape of software development, the pursuit of creating flawless and efficient software is a perpetual challenge. However, the presence of software defects stands as an inherent reality in this complex process. Software Defect Prediction (SDP) has been a common topic in study literature. Different methods and approaches have been developed to do the prediction in different datasets. In this research, outlier detection algorithms are used to conduct experiments in SDP. Isolation Forest, Local Outlier Factor, and One-Class SVM are the three outlier detection models used in this research. The experimental results show that One-Class SVM has better performance than the other models with the F1 score reaching 0.9101 and accuracy up to 0.84.

Original languageEnglish
Title of host publication2024 2nd International Conference on Software Engineering and Information Technology, ICoSEIT 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages204-209
Number of pages6
ISBN (Electronic)9798350317503
DOIs
Publication statusPublished - 2024
Event2nd International Conference on Software Engineering and Information Technology, ICoSEIT 2024 - Bandung, Indonesia
Duration: 28 Feb 202429 Feb 2024

Publication series

Name2024 2nd International Conference on Software Engineering and Information Technology, ICoSEIT 2024

Conference

Conference2nd International Conference on Software Engineering and Information Technology, ICoSEIT 2024
Country/TerritoryIndonesia
CityBandung
Period28/02/2429/02/24

Keywords

  • outlier detection
  • software defect prediction

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