Abstract
Amorphous Fe-Ti-Sb (FTS) thin film was prepared on a 0.3-µm SiO2/Si wafer by a DC magnetron sputtering method to investigate the spintronic thermoelectric (STE) properties based on the anomalous Nernst effect (ANE) and spin Seebeck effect (SSE). A platinum (Pt) ultra-thin layer was coated on top FTS (Pt/FTS) thin film surface to be used for the spin Hall detector. The crystal structure, morphology, composition and magnetic characteristics of as-deposited FTS and Pt/FTS thin films were carried out by x-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive x-ray spectroscopy (EDS), and vibrating sample magnetometry (VSM), respectively. As a result, the crystal structure and morphology displayed a metallic-glass type within the amorphous phase and a smooth surface. The magnetic characterization showed that an ANE and SSE of FTS thin film to yield a spin Seebeck coefficient (Ss) of around 0.35 µV K− 1.
| Original language | English |
|---|---|
| Pages (from-to) | 989-993 |
| Number of pages | 5 |
| Journal | Journal of Electronic Materials |
| Volume | 52 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Feb 2023 |
Keywords
- Amorphous Fe-Ti-Sb thin films
- anomalous Nernst effect
- magnetron sputtering
- spin Seebeck effect
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