In this study, RAM composite has been succesfully synthesized by mixing BaM as magnetic materials and PANI as conductive materials. BaM and PANI materials were prepared separately by solid state method and polymerization method, respectively. To investigated the presence of BaM phase and magnetic property of the as prepared BaM, XRD pert PAN analytical and VSM 250 Dexing Magnet were employed. Inductance Capacitance Resistance technique was carried out to measure electrical conductivity of the synthesized PANI materials. In order to further characterized the structural features of BaM and PANI, SEM-EDX FEI 850 and FTIR characterizations were conducted. RAM composite was prepared by mixing BaM and PANI powders with ultrasonic cleaner. Afterwards, VNA (Vector Network Analyzer) characterization was carried out to determine reflection loss value of RAM by applying mixed RAM composite and epoxy paint on aluminum plate using spray gun. Microscopic characterization was employed to investigated the distribution of RAM particles on the substrate. It was found that reflection loss value as low as -27.153 dB was achieved when applied 15 wt% BaM/PANi composite at 100.6 μm thickness. In addition, the absorption of electromagnetic waves value increase as the addition of RAM composite composition increases.