TY - GEN
T1 - The landmark variation improvement on the different modalities for the facial sketch features detection
AU - Muntasa, Arif
AU - Sophan, Mochammad Kautsar
AU - Hery, Mauridhi P.
AU - Kunio, Kondo
PY - 2012
Y1 - 2012
N2 - Facial feature detection studies on the same modality have been conducted by many researchers, but the research results cannot be implemented on the different modality, only a few studies that can be used to detect the facial features on the different modality. In this research, we proposed method to detect the facial features on the different modality. The deviation standard on the landmark variations improvement has been considered as parameters to improve the moving direction toward the corresponding features. The experimental results show that the detection accuracy of our proposed method is 91.944% for the 1st model and 91.46% for the 2nd model. Our proposed method has been shown outperformed the mixture model method.
AB - Facial feature detection studies on the same modality have been conducted by many researchers, but the research results cannot be implemented on the different modality, only a few studies that can be used to detect the facial features on the different modality. In this research, we proposed method to detect the facial features on the different modality. The deviation standard on the landmark variations improvement has been considered as parameters to improve the moving direction toward the corresponding features. The experimental results show that the detection accuracy of our proposed method is 91.944% for the 1st model and 91.46% for the 2nd model. Our proposed method has been shown outperformed the mixture model method.
KW - detection
KW - facial features
KW - landmark variation
KW - the different modality
UR - http://www.scopus.com/inward/record.url?scp=84873965613&partnerID=8YFLogxK
U2 - 10.1109/ICCircuitsAndSystems.2012.6408330
DO - 10.1109/ICCircuitsAndSystems.2012.6408330
M3 - Conference contribution
AN - SCOPUS:84873965613
SN - 9781467331197
T3 - ICCAS 2012 - 2012 IEEE International Conference on Circuits and Systems: "Advanced Circuits and Systems for Sustainability"
SP - 131
EP - 136
BT - ICCAS 2012 - 2012 IEEE International Conference on Circuits and Systems
T2 - 2012 IEEE International Conference on Circuits and Systems: "Advanced Circuits and Systems for Sustainability", ICCAS 2012
Y2 - 3 October 2012 through 4 October 2012
ER -