Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

S. Pratapa, B. H. O'Connor*, I. M. Low

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application - determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.

Original languageEnglish
Pages (from-to)166-170
Number of pages5
JournalPowder Diffraction
Volume13
Issue number2
DOIs
Publication statusPublished - Jun 1998

Keywords

  • Aluminium titanate/zirconia-alumina ceramic
  • Compton scattering
  • Functionally-graded
  • Mass attenuation corrections
  • Rietveld phase analysis
  • X-ray fluorescence spectrometry

Fingerprint

Dive into the research topics of 'Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard'. Together they form a unique fingerprint.

Cite this