Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

S. Pratapa; B. H. O'Connor; I. M. Low

doi:10.1017/s0885715600010046

Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

S. Pratapa
, B. H. O'Connor^*
, I. M. Low

^*Corresponding author for this work

Curtin University

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application - determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.

Original language	English
Pages (from-to)	166-170
Number of pages	5
Journal	Powder Diffraction
Volume	13
Issue number	2
DOIs	https://doi.org/10.1017/s0885715600010046
Publication status	Published - Jun 1998

Keywords

Aluminium titanate/zirconia-alumina ceramic
Compton scattering
Functionally-graded
Mass attenuation corrections
Rietveld phase analysis
X-ray fluorescence spectrometry

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10.1017/s0885715600010046

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title = "Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard",

abstract = "Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application - determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.",

keywords = "Aluminium titanate/zirconia-alumina ceramic, Compton scattering, Functionally-graded, Mass attenuation corrections, Rietveld phase analysis, X-ray fluorescence spectrometry",

author = "S. Pratapa and O'Connor, \{B. H.\} and Low, \{I. M.\}",

note = "Funding Information: S. Pratapa is grateful to the Australian Agency for International Development (AusAID) for scholarship support. We also acknowledge assistance with the X-ray fluorescence spectrometry measurements provided by our colleague Professor Deyu Li.",

year = "1998",

month = jun,

doi = "10.1017/s0885715600010046",

language = "English",

volume = "13",

pages = "166--170",

journal = "Powder Diffraction",

issn = "0885-7156",

publisher = "Cambridge University Press",

number = "2",

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T1 - Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

AU - Pratapa, S.

AU - O'Connor, B. H.

AU - Low, I. M.

N1 - Funding Information: S. Pratapa is grateful to the Australian Agency for International Development (AusAID) for scholarship support. We also acknowledge assistance with the X-ray fluorescence spectrometry measurements provided by our colleague Professor Deyu Li.

PY - 1998/6

Y1 - 1998/6

N2 - Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application - determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.

AB - Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application - determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.

KW - Aluminium titanate/zirconia-alumina ceramic

KW - Compton scattering

KW - Functionally-graded

KW - Mass attenuation corrections

KW - Rietveld phase analysis

KW - X-ray fluorescence spectrometry

UR - https://www.scopus.com/pages/publications/0032380836

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DO - 10.1017/s0885715600010046

M3 - Article

AN - SCOPUS:0032380836

SN - 0885-7156

VL - 13

SP - 166

EP - 170

JO - Powder Diffraction

JF - Powder Diffraction

IS - 2

ER -

Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

Abstract

Keywords

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